Advanced X-Ray Inspection Techniques for Electronic Devices
A new article by Alex Kitt, Applications Engineer Chris Lee, Intern, EWI
Digital radiography (DRT) and computed tomography (CT) are powerful imaging tools. EWI used both to analyse a tablet manufactured with the most common quality defects, as well as a defect-free device. This paper discusses the analysis and resulting recommendations to the manufacturer to ensure future product quality.
EWI is the leading engineering and technology organization in North America dedicated to developing, testing, and implementing advanced manufacturing technologies for industry. By matching our expertise to the needs of our clients, we help manufacturers innovate premium, game-changing solutions that deliver a competitive advantage in the global marketplace.