Advanced X-Ray Inspection Techniques for Electronic Devices

LeeA new article by
Alex Kitt, Applications Engineer
Chris Lee, Intern

Digital radiography (DRT) and computed tomography (CT) are powerful imaging tools. EWI used both to analyse a tablet manufactured with the most common quality defects, as well as a defect-free device. This paper discusses the analysis and resulting recommendations to the manufacturer to ensure future product quality.

To download the article, click here.

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