Computed tomography (CT) is one of the most effective methods of inspecting additvely manufactured components. The cost of the process and the time it takes, however, has been a disincentive to widespread adoption.
EWI has developed a new CT solution using fewer image captures that can save both time and cost. This technique is discussed in a paper by EWI engineers Luke Mohr and Alex Kitt, A New Approach to Reduce CT Scan Time and Cost.
You are invited to download this paper, at no charge, by completing the form on this page.
If you would like to learn more about faster CT contact Alex Kitt at [email protected]. For more information about EWI’s work in NDE inspection methods, click here.
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